產品敘述
Features:
No inteference of AFM registration laser with Raman excitation laser
Direct (below objective) pathway to cantilever
Easy, quick and repeatable cantilever’s adjustment
Automated AFM registration system adjustment
Fast scanning Vibration stability, Acoustic stability, Fast scanner with high resonant frequencies
Ease of sample replacement Top and side optical access
Top and side objective scanners Built-in DFM measuring made with PLL
STM, Conductive AFM and SNOM options
