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品牌: Horiba France SAS (HFR)

應用: 金屬材料電子材料陶瓷礦物化學工業 / 製程安全能源研發 / 電池測試

GD-Profiler 2

Goods number:
GD-Profiler 2 提供了快速、同時分析所有感興趣的元素,包括氮、氧、氫和氯。是多層鍍薄縱深分析的理想工具。

RF射頻,可以在脈衝模式下檢測易碎的樣品,GD-Profiler 的應用範圍適合從鍍層,薄膜的控制到金屬和合金產品的研究。

多通道(同時)型光學系統可全光譜覆蓋,光譜範圍:110nm至900nm,包含遠紫外區(選配),可分析C, H,O,N,S

產品敘述

Features:

  • RF-Only generator is Class E standard and optimized for stability and crater shape allowing for real surface analysis.
  • Source can be pulsed with synchronized acquisition for optimum results on fragile samples. The use of an RF source allows analysis of conventional and non conventional layers and materials.
  • Simultaneous optic provides full spectral coverage from 110 to 800nm, including deep UV access to analyze H, O, C, N and Cl.
  • HORIBA original, ion-etched holographic gratings assure the highest light throughput and resolution for maximum light efficiency and sensitivity.
  • Patented HDD detection provides speed and sensitivity in detection without compromise.
  • On line measurement of crater depth and erosion rate with patented built in Interferometer. DIP.
  • Easily accessible sample compartment allows plenty of room for sample loading.
  • Powerful QUANTUM™ software with Tabler report writing tool.
  • CenterLite laser pointer (patent pending) for precise sample loading.

Monochromator option available only from HORIBA provides the perfect tool to increase instrument flexibility while adding "n+1" capability.

詳細規格

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